|
If we were to use an epitaxial
reactor for wafers covered with oxide, a layer of Si would still be
deposited on the hot surface - but now it would have no "guidance"
for its orientation, and poly-crystalline Si layers (often just called "poly" or "polysilicon") would result.
|
|
 |
Poly-Si
is one of the key materials in microelectronics, and we know already how to
make it: Use a CVD reactor and run a process similar to
epitaxy. |
|
 |
If doping is required (it often is), admit the
proper amounts of dopant gases. |
 |
However, we also want to do it cheap,
and since it we want a polycrystalline layer, we don't have to pull all the
strings to avoid crystal lattice defects like for epitaxial Si layers.
|
|
 |
We use a more simple CVD reactor of the
furnace type shown for oxide
CVD, and we employ smaller temperatures (and low pressure, e.g. 60
Pa since we only need thin layers and can afford lower deposition rates).
This allows to use SiH4 instead of SiCl4;
our process may look like this: |
|
|
|
|
|
| |
60 Pa |
|
| SiH4 |
Þ |
Si + 2 H2 |
| |
630oC |
|
|
|
|
|
|
|
 |
Much cheaper! The only (ha ha) problem now is:
Cleaning the furnace. Now you have
poly-Si all over the place; a little bit nastier than
SiO2, but this is something you can live with. |
 |
What is poly-Si used for and
why it is a key material? |
|
 |
Lets look at a TEM (= transmission
electron microscope) picture of a memory cell (transistor and capacitor) of a
16 Mbit DRAM. For a larger size picture and additional pictures
click here. |
|
|
|
|
|
|
|
|
|
|
All the speckled looking stuff is
poly-Si. If you want to know exactly what you are looking at, turn to
the drawing of this
cross section. We may distinguish 4 layers of poly Si: |
|
 |
"Poly
1" coats the inside of the trench (after its surface has
been oxidized for insulation) needed for the capacitor. It is thus one of the
"plates" of the capacitor. In the 4 Mbit DRAM the substrate
Si was used for this function, but the space charge layer extending into
the Si if the capacitor is charged became too large for the 16 Mbit
DRAM. |
|
 |
The "Poly
2" layer is the other "plate" of the
capacitor. The
ONO dielectric
in between is so thin that it is practically invisible. You need a
HRTEM - a high
resolution transmissin electron microscope -
to really see it. |
|
 |
Now we have a capacitor folded into the trench,
but the trench still needs to be filled. Poly-Si is the material of
choice. In order to insulate it from the poly capacitor plate, we oxidize it to
some extent before the "poly
3" plug is applied. |
 |
One plate of the capacitor needs to
be connected to the source region of the transistor. This is "simply"
done by removing the insulating oxide from the inside of the trench in the
right place (as indicated). |
|
 |
Then we have a fourth
poly layer, forming the gates of the transistors. |
|
 |
And don't forget: there were two sacrificial poly-Si layers for
the LOCOS process! |
 |
That makes 6 poly-Si
deposition (that we know off). Why do we like poly-Si so much? |
|
 |
Easy! It is perfectly compatible with single
crystalline Si. Imagine using something else but poly-Si for the
plug that fills the trench. If the thermal expansion coefficient of
"something else" is not quite close to Si, we will have a
problem upon cooling down from the deposition temperature. |
|
 |
No problem with poly. Moreover, we can oxidize
it, etch it, dope it, etc. (almost) like single crystalline Si. It only
has one major drawback: Its conductivity is
not nearly as good as we would want it to be. That is the reason why you often
find the poly-gates (automatically forming one level of wiring)
"re-enforced" with a silicide layer on
top. |
|
 |
A silicide is a metal silicon compound, e.g.
Mo2Si, PtSi, or Ti2Si, with an
almost metallic
conductivity that stays relatively inert at high temperatures (in contrast
to pure metals which react with Si to form a silicide). The resulting
double layer is in the somewhat careless slang of microelectronics often called
a "polycide" (its precise
grammatical meaning would be the killing of the poly - as in fratricide or
infanticide). |
|
 |
Why don't we use a silicide right away, but only
in conjunction with poly-Si? Because you would loose the all-important
high quality interface of
(poly)-Si and SiO2! |
|
|
|
|
We have seen several uses for silicon
nitride layers - we had LOCOS, FOBIC (and there are more), so we need a
process to deposit Si3N4
. |
|
 |
Why don't we just "nitride" the
Si, analogous to oxidations, by heating the Si in a
N2 environment? Actually we do - on occasion. But
Si3N4 is so impenetrable to almost everything -
including nitrogen - that the reaction stops after a few nm. There is
simply no way to grow a "thick" nitride layer thermally. |
|
 |
Also, don't forget: Si3N4
is always producing tremendous stress, and you don't want to have it
directly on the Si without a buffer oxide in between. In other words: We
need a CVD process for nitride. |
 |
Well, it becomes boring now: |
|
 |
Take your CVD furnace from before, and use
a suitable reaction, e.g.
. |
|
|
|
|
|
| 3 SiH2Cl2 + 4NH3 |
Þ |
Si3N4 + 2HCl + 1,5 H2 |
| |
(» 700 oC)) |
|
|
|
|
|
|
|
 |
Nothing to it - except the cleaning bit. And the
mix of hot ammonia (NH3) and HCl occurring
simultaneously if you don't watch out. And the waste disposal. And the problem
that the layers, being under internal stresses, might crack upon cooling down.
And, - well, you get it! |
|
|
|
|
For reasons that we will explain
later, it became necessary at the end of the eighties, to deposit a metal
layer by CVD methods. Everybody would have loved to do this with
Al - but there is no good CVD process for Al; nor for most
other metals. The candidate of choice - mostly by default - is
tungsten (chemical symbol
W for
"Wolfram"). |
|
 |
Ironically, W-CVD comes straight form
nuclear power technology. High purity Uranium
(chemical symbol
U) is made by a
CVD process not unlike the
Si Siemens process using UF6 as the gas that
decomposes at high temperature. |
|
 |
W is chemically very similar to U, so we
use WF6 for W-CVD. |
 |
A CVD furnace, however, is not
good enough anymore. W-CVD needed its own equipment, painfully (and
expensively) developed a decade ago. |
|
 |
We will not go into details, however. CVD
methods, although quite universally summarily described here, are all rather
specialized and the furnace type
reactor referred to here, is more an exception than the rule. |
|
|
|
|
CVD processes
are ideally suited for depositing thin layers of materials on some substrate.
In contrast to some other deposition processes which we will encounter later,
CVD layers always follow the contours of the substrate: They are
conformal to the substrate as shown below. |
|
|
|
|
|
|
|
|
|
 |
Of course, conformal deposition
depends on many parameters. Particularly important is which process dominates
the reaction: |
|
 |
Transport controlled
process (in the gas phase). This means that the rate at which gas
molecules arrive at the surface controls how fast things happen. This implies
that molecules react immediately wherever they happen to reach the hot surface.
This condition is always favored if the pressure is
low enough. |
|
 |
Reaction controlled
kinetics. Here a molecule may hit and leave the surface many times
before it finally reacts. This reaction is dominating at high pressures. |
 |
Controlling the partial pressure of
the reactants therefore is a main process variable which can be used to adjust
layer properties. |
|
 |
It is therefore common to distinguish between
APCVD (=
atmospheric pressure CVD) and
LPCVD (= low
pressure CVD). |
|
 |
LPCVD, very generally speaking, produces
"better" layers. The deposition rates, however, are naturally much
lower than with APCVD. |
 |
CVD
deposition techniques, though quite universal and absolutely essential, have
certain disadvantages, too. The two most
important ones (and the only ones we will address here) are |
|
 |
They are not possible for some materials; there
simply is no suitable chemical reaction. |
|
 |
They are generally not suitable for mixtures of materials. |
 |
To give just one
example: The metallization layers for many years were (and mostly still are)
made from Al - with precise additions of Cu and Si in the
0,3% - 1% range |
|
 |
There is no suitable Al-compound that
decomposes easily at (relatively low) temperatures. This is not to say that
there is none, but all Al-organic chemicals known are too dangerous to
use, to expensive, or for other reasons never made it to production (people
tried, though). |
|
 |
And even if there would be some Al CVD
process, there is simply no way at all to incorporate Si and Cu
in the exact quantities needed into an Al CVD layer (at least nobody has
demonstrated it so far). |
 |
Many other materials, most notably
perhaps the silicides, suffer from similar problems with respect to CVD.
We thus need alternative layer deposition techniques; this will be the subject
of the next subchapter. |
|
|
|
|
|
|
|
|
|
|
|
| Footnote: |
The name "Poly
Silicon" is used for at least three qualitatively very
different kinds of materials: |
|
1. The "raw material" for crystal growth, coming
from the "Siemens" CVD
process. It comes - after breaking up the rods - in large chunks suitable
for filling the crucible of a crystal grower. |
|
2. Large ingot of cast
Si and the thin sheets made from
them; exclusively used for solar cells. Since the grains are very large in this
case (in the cm range), this material is often referred to as "multi crystalline Si". |
|
3. The thin layers of poly Si addressed in this
sub-chapter, used for micro electronics and micro mechanical technologies.
Grain sizes then are µm or less. |
| |
In addition, the term poly Si
might be used (but rarely is) for the dirty stuff
coming out of the Si smelters, since this
MG-Si is certainly
poly-crystalline |
© H. Föll (Electronic Materials - Script)