Thomas Strunskus was born in Lübeck, Germany, in 1962. He received his Ph.D. in physical chemistry from the University of Heidelberg in 1993, working on metal/polyimide interfaces. From Fall 1987 to Spring 1992 he did his research in the Surface Science Lab at the University of Maine in Orono. During this time he obtained a Master in Physics. In 1994 he joined the Chair for Multicomponent Materials within the Faculty of Materials Science and Engineering at Kiel University as an assistant of Prof. Franz Faupel working on vapor phase deposition of polymers and metal-polymer interfaces as well as metal-polymer nanocomposites. In 2001 he worked in the group of Prof. Christof Wöll in physical chemistry on the characterization of thin films by synchrotron based x-ray methods (XPS, NEXAFS and XES). In 2006/2007 he moved back to Kiel joined again the group of Prof. Franz Faupel as one of his assistants being involved in most of the research fields of the Chair. Besides that his specialty is still the use of synchrotron radiation for XPS and NEXAFS measurements. He also serves on the editorial boards of Materials.

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