|Two more pictures from D. Appel and his group from the research center GKSS in Geesthacht.
|The first one shows a medium magnification bright field picture of TiAl, just showing a lot of boundaries, stacking faults and dislocations
|Not the parallel arrangement of some dislocations, which run right through the sample and move on the same glide plane, probably coming from some active source in the boundary.
|The following pictures shows a time sequence of the same part of the specimen after successive annealing treatments. The changes in the dislocation structure (some pointed out by arrows) are due to climb processes.
6.3.3 Stacking Faults and Other Defects
Dislocations in TiAl
© H. Föll (Defects - Script)