Correlation between sputter deposition parameters and I-V characteristics in double-barrier memristive devices
Zahari, F., Schlichting, F., Strobel, J., Dirkmann, S., Cipo, J., Gauter, S., Trieschmann, J., Marquardt, R., Haberfehlner, G., Kothleitner, G., Kienle, L., Mussenbrock, T., Ziegler, M., Kersten, H., Kohlstedt, H.
Journal of Vacuum Science & Technology B 37, 061203 (2019)

Characterization of VO2/ferroelectric thin film heterostructures deposited on various complex oxide single crystal substrates
Petraru, A., Droopad,R.,Kohlstedt, H.
Journal of Vacuum Science & Technology A 37, 021514 (2019)

Inherent stochastic learning in CMOS integrated HfO2 arrays for neuromorphic computing
Wenger, Ch., Zahari, F., Mahadevaiah, M. K., Perez, E., Beckers, I., Kohlstedt, H., Ziegler, M.
IEEE Electron Device Letters 40(4) (2019)

A stress sensor based on a silicon field effect transistor comprising a piezoelectric AlN gate dielectric
Winterfeld, H., Thormählen, L., Lewitz, H., Yarar, E., Birkoben, T., Niethe, N., Preinl, N., Hanssen, H., Quandt, E., Kohlstedt, H.
J Mater Sci: Mater Electron (2019)

Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing
Mahadevaiah, M. K, Perez, E., Wenger, Ch., Grossi, A., Zambelli, C., Olivo, P., Zahari, F., Kohlstedt, H., Ziegler, M.
IEEE International Reliability Physics Symposium (IRPS) (2019)