Setup for Thermal Characterization

The laboratory of the Chair is equipped with a setup for Thermal Characterization of Power Electronic Converters (TC-PEC). This setup enables the thermal characterization of power electronics in real operating conditions which is relevant for a cost effective system design and can be used for lifetime prediction of the components. The voltage range of the equipment enables tests for low voltage and medium voltage devices. The setup consists of:

•  A high speed Infrared Camera with positioning system (355 Hz sampling frequency for 640x542 pixel)

•  An Optic fiber temperature measurement system (8 channels, sensor response times up to 5 ms)

•  DC power source (4 kV, 60 kW)

•  AC power source (45 kW)

•  Electronic loads

•  Power analyzer with 6 channels

•  A 12 Bit Oscilloscope

New High Speed Thermal Measurement System for Semiconductor Reliability Analysis

The overall setup is managed by a control and synchronization system, which controls every component and merges the measurements.