Publication List, Vladimir Zaporojtchenko 

Published or accepted 

1. Measurment of ionization cross section of inner shells. V.Zaporojtchenko and G.Kashin, 
    J.Electron.Spectr. and Relat. Phenom. 37, 269 (1985) 

2. Charakterizirung von Öberflächen durch Electronenspektroskopie und Elektronenbeugung. V.Kuleshov, 
    A. Naumovez, V.Zaporojtchenko , Fachbuch, Nauka, Moskau,1985 .

3. Anizotropy of the Auger-Emission from surface of monocristal Cu,Fe. V.Zaporojtchenko, A.Nosov,  
    Poverchnost,6,34(1986) 

4. Experimental verification of the determination of bacscattering factor. V.Zagorenko,V. Zaporojtchenko, 
    Poverchnost,(Surface) N4, 41 (1988). 

5. Quantitative electron spectroscopy of binari systems. A.Zagorenko, V. Zaporojtchenko, 
    Surf. and Interface Anal., 14, 438 (1989).

6. The application of electron spectroscopy to the electron structure analysis of the rare earth compounds. M.Buleev,
    A.Dementijev, V.Zaporojtchenko, Proc.II Int.Vac. Congress, 166 (1989). 

7. The Calibration of Energy of Electron Spectrometer. V.Zaporojtchenko, E.Matin, V.Rachovsky, 
    Izmerit. Technik., N5, 64 (1989).

8. Study of the characteristics of elastic and inelastic reflection of electrons from a copper surface.
   G.Kurbatov, V.Zaporojtchenko, J. Electron Spectr. & Relat. Phenom. 53, 29 (1990). 

9. Modified form of the Auger-parameters calculated from Auger spectra, the analysis of the chemical binding. 
    V. Zaporojtchenko, E.Matin, I. Topol, Surface Sci.,251, 350 (1991). 

10. The Calibration of Electron Spectrometer Intensity-Energy Response Functions. G.Kurbatov, V. Zaporojtchenko,
      Surf. and Interf. Anal., 16, 221 (1990).

11. Quantitative depth analysis of impurities in solids based on combination AES and EMPA. A.Alexeyev, 
      V.Zaporojtchenko, Vacuum, 41, 1725 (1990). 

12. Electron probe X-ray microanalysis as a non-destructive method for the quantitative determination of the 
      ion-implanted impurites in silicon. A.Alexeyev, V.Zaporojtchenko, J. Anal. Chem., 341, 601 (1991) 

13. Study of the changes in silicide surface composition. V.Zaporojtchenko, S.Vojtusik, A.Zagorenko, 
      Surf. Sci., 17, 237 (1991). 

14. Comparision of accuracy of various AES-methods for quantitative analysis of refractory metal silicides. 
      A.Zagorenko, V.Zaporojtchenko, Surf. and Interf. Anal., 17, 237 (1991). 

15. Quantitative electron spectroscopy of metal oxides. A.Zagorenko, V.Zaporojtchenko, 
      Surf. and Interf. Anal., 18, 496 (1992). 

16. AES factor analysis rubber-to-brass interface. G.Kurbatov, V.Zaporojtchenko, 
      Surf. and Interf. Anal., 23, 318 (1993). 

17. Study of concentration-depth profiles in CoSi near-surface layer after ion bombardment. S.Vojtusik, 
      V.Zaporojtchenko., Surf. and Interf. Anal., 19, 80 (1992). 

18. Effect of ion insidence angle on surface concentrations in Ar-bombarded CoSi. V.Zaporojtchenko, S.Vojtusik, 
      M.Stepanova, Surf. and Interf. Anal., 23, 185 (1993). 

19. Preferential sputtering in binary targets. V.Zaporojtchenko, M.Stepanova, 
      Progress in Surface Science, 49, 155 (1995). 

20. Preferential sputtering and surface binding energies. V.Zaporojtchenko, S.Vojtusik, M.Stepanova, 
      Vacuum, 47, 424 (1996). 

21. Variation of surface composition of transition-metal siliciedes during sputtering by argon ions with a 
      neahr-threshold energy.V.Zaporojtchenko, E.Matin, M.Stepanova, Surface Invstigation, 12, 957 (1997). 

22. Fundamental Aspects of Polymer Metallization. 
      F. Faupel, T. Strunskus, M. Kiene, A. Thran, C. v. Bechtolsheim, V. Zaporojtchenko, 
      Mat. Res. Soc. Symp. Proc. 511 "Low-Dielectric Constant Materials IV" Eds. C. Chiang, J.T. Wetzel, 
      T-M. Lu, P.S. Ho, (1998), invited paper.

23. Condensation coefficients of silver on polymers. A. Thran, M. Kiene, V. Zaporojtchenko, and F. Faupel,
      Phys. Rev. Lett. 82, 1903 (1999). 

24. Condensation coefficients and initial stages of growth for noble metals deposited onto chemically different 
      polymer surfaces. V. Zaporojtchenko, K. Behnke, A. Thran, T. Strunskus, and F. Faupel, 
      Appl. Surf. Sci. 144-145, 355 (1999).

25. Metal/polymer interfaces with designed morphologies. V. Zaporojtchenko, T. Strunskus, K. Behnke, 
      C. v. Bechtolsheim, M. Kiene, F. Faupel, J. Adhes. Sci. Technol. 14, 491 (2000).

26. Interface structure and formation between gold and trimethylcyclohexane polycarbonate.
      C. v. Bechtolsheim, V. Zaporojtchenko and F. Faupel, J. Mater. Res. 14, 3538 (1999). 

27. Influence of thermal treatment on the morphology and adhesion of gold films on TMC-Polycarbonate.
      C. v. Bechtolsheim, V. Zaporojtchenko, and F. Faupel, Appl. Surf. Sci. 270, 119 (1999).

28. XPS Study of the Initial Oxidation of the Bulk Metallic Glass Zr_46.75Ti_8.25Cu_7.5Ni₁₀Be_27.5
      S. K. Sharma, T. Strunskus, H. Ladebusch, V. Zaporojtchenko, F. Faupel submitted to Appl. Surf. Sci.

29. Herstellung von Edelmetallcluster/Polymer-Kompositfilmen durch ein Gasphasen abscheidungsverfahren.
      K. Behnke, V. Zaporojtchenko, T. Strunskus, F. Faupel, in Verbundwerkstoffe und Werkstoffverbunde, 
      K. Schulte und K.U. Kainer (Hrsg.), Wiley-VCH, Weinheim (1999), p. 549.

30. Metall/Polymer-Verbunde: Grenzflächendesign zur Haftungssteigerung.
      T. Strunskus, V. Zaporojtchenko, C. v. Bechtolsheim, K. Behnke, F. Faupel, in Verbundwerkstoffe und  
     Werkstoffverbunde, K. Schulte und K. U. Kainer (Hrsg.), Wiley-VCH, Weinheim (1999), p. 543.

31. Extremely low metal condensation coefficients determined on low-k polymers.
      A. Thran, M. Kiene, V. Zaporojtchenko, and F. Faupel, MRS Bulletin, July 1999, p.3.

32. Nucleation, Growth, Interdiffusion, and Adhesion of Metal Films on Polymers.
      F. Faupel, A. Thran, V. Zaporojtchenko, M. Kiene, T. Strunskus, and K. Behnke, 
      in: Stress-Induced Phenomena in Metallization, 5^th Int. Workshop, O. Kraft, E. Arzt, C. A. Volkert, P. S. Ho,
      and H. Okabayashi (Eds.), AIP Conf. Proc. 491, Stuttgart 1999, invited paper.

33. The effects of bottom electrode on the microstructure and dielectric properties of sol-gel processed PZT thin 
      films.M. ES-Souni, A. Piorra, S. Malinovski, V.Zaporojtchenko, J.of Mater. Res. in press 

34. Determination of condensation coefficients of metals on polymer surfaces.
      V. Zaporojtchenko, K. Behnke, T. Strunskus, and F. Faupel, Surf. Sci. , 454-456 (2000), 412-416

35. Diffusion of metals in polymers and during metal-polymer interface formation.
      F. Faupel, A. Thran, M. Kiene, T. Strunskus, V. Zaporojtchenko, and K. Behnke,
      in: Low Dielectric Constant Materials for IC Applications, P. S. Ho, W. W. Lee, and J. Leu (Eds.), 
      Springer Verlag, invited book chapter, in press. 

36. Controlled nucleation and growth of noble metals on polymers.
      V. Zaporojtchenko, T. Strunskus, K. Behnke, and F. Faupel, in Proc. Euromat, Volume 9, 
      Interface Controlled Materials (Eds.: M. Rühle et al.), in press.

37. Condensation coefficients of noble metals on polymers: A novel method of determination by X-ray photoelectron
      spectroscopy. V. Zaporojtchenko, K. Behnke, T. Strunskus, F. Faupel, 
      Surf. Interf. Anal., 30, 439-443 (2000) 

38. Formation of metal-polymer interfaces by metal evaporation: influence of deposition parameters and defects.
      V. Zaporojtchenko ; T. Strunskus ; K. Behnke ; C.v. Bechtolsheim ; A. Thran ; F. Faupel 
      Microelectronic engineering 50, 465-472 (2000)

39. Tailoring the morphology of metal/polymer interfaces.T. Strunskus, V. Zaporojtchenko, K. Behnke, 
      C. v. Bechtolsheim, and F. Faupel, Adv. Eng. Mater. 2000, 2, No. 8, 489- 492 (invited Research News).

40. Metal/polymer interfaces and composite materials prepared by vapor phase deposition.
      K. Behnke, T. Strunskus, V. Zaporojtchenko, and F. Faupel, Proc. MicroMat 2000.

41. Embedding of noble matal naoclusters into polymers as probe of the surface glass transition .
      V. Zaporojtchenko, T. Strunskus and F. Faupel, Macromolecules 02,13 2001

42. Comparison of the Surface and Bulk Glass Transition of Polystyrene. R. Weber, K.-M. Zimmermann, M. Tolan, 
      J. Stettner, O.H. Seeck, J. Erichsen, V. Zaporojtchenko, T. Strunskus, F. Faupel, W.,
      Press Submitted to PRL (2000)

42. Current model considering oxide thickness non-uniformity in a MOS tunnel structure.
      M.I.Vexler, A.Schulekin, Ch.Dieker, V.Zaporojtchenko, H.Zimmermann, W. Jaeger, P. Seegebrecht
      Solid –State Electronics, vol. 45, No 1, 19-25, (2001)

last update: 09.05.2001