Necking

Here is an X-ray topograph of the first part of crystal growth
An X-ray topograph is similar to a transmission electron micorscope image - it shows the interior of the sample and dislocations are visible as dark lines.
 
Necking in Si crystal growth
Courtesy of Wacker / Siltronic; Burghausen, Germany
 

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© H. Föll (Electronic Materials - Script)