6. Observing Dislocations and Other Defects

6.1 Decoration and Conventional Microscopy

6.1.1 Preferential Etching

6.1.2 Infrared Microscopy

6.2 X-Ray Topography

6.3 Transmission Electron Microscopy

6.3.1 Basics of TEM and the Contrast of Dislocations

6.3.2 Examples and Case Studies for Dislocations

6.3.3 Stacking Faults and Other Two Dimensional Defects

6.3.4 High Resolution TEM

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© H. Föll (Defects - Script)