# 6. Observing Dislocations and Other Defects

## 6.1 Decoration and Conventional Microscopy

### 6.1.1 Preferential Etching

### 6.1.2 Infrared Microscopy

## 6.2 X-Ray Topography

## 6.3 Transmission Electron Microscopy

### 6.3.1 Basics of TEM and the Contrast of Dislocations

### 6.3.2 Examples and Case Studies for Dislocations

### 6.3.3 Stacking Faults and Other Two Dimensional Defects

### 6.3.4 High Resolution TEM

© H. Föll (Defects - Script)