# Comparison of Weak-Beam and Bright Field Conditions

| The two pictures below show the extremes in resolution.
|  | On the left hand side is a weak beam image of a dislocation network in a small angle grain boundary in Si; it has optimum resolution. The dislocation end at a SiO2 precipitate which shows faint fringes due to Moirée effects (the Si precipitate is sandwiched between Si crystals which are slightly misoriented).
|  | On the right hand side is the same area imaged with (rather dynamical) bright field conditions. The dislocation lines are very broad and their images interfere with each other; it would be difficult to interpret this picture.

With frame

6.3.2 Examples and Case Studies for Dislocations

© H. Föll (Defects - Script)